Manufacturing Engineering Laboratory NIST logo
HOME About MEL Research products and services what's new search

Go back to 
Photo page

Changing inspection probes on the NGIS coordinate measuring machine 1pixw.gif - 43 Bytes
Changing inspection probes on the NGIS
The NGIS project is using a variety of analog probes and video cameras to speed the inspection process. Bill Rippey attaches a three-dimension touch probe to a magnetic mount on the CMM arm
Intelligent Systems Division
melwebmaster@nist.gov
Manufacturing Engineering Laboratory Skip navigation