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Publications

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Publication summary

Author(s): Lisa Carnahan, Gary Carver, Martha Gray, Mike Hogan, Ted Hopp, Jeffrey Horlick, Gordon Lyon and Elena Messina

Publication date: May 1997

Citation: Lisa Carnahan, Gary Carver, Martha Gray, Mike Hogan, Ted Hopp, Jeffrey Horlick, Gordon Lyon and Elena Messina: "Metrology for Information Technology (IT)," NISTIR 6025, National Institute of Standards and Technology, Gaithersburg, MD, 1997.

Key words: metrology, information technology, digital information technology, digital systems, conformance testing, interoperability testing, IT metrology

Availability:

  • HTML
  • A paper copy of this document is available by contacting Kristy Thompson [web,email]
Abstract:
The scope of this white paper is the testing or measuring of digital information technology (IT) systems attributes or proporties; the use of digitial IT systems in testing and measuring; and the underlying mathematical, computational, and statistical sciences used in testing and measuring. This paper suggests a conceptual basis for IT metrology; reviews IT testing methods, the status of IT metrology, and opportunities for advancing IT metrology; and notes possible roles for NIST. One goal of this white paper is to apply the concepts of metrology to IT systems. Another goal is to relate measurements in IT to established concepts of traceability.

Attention users of these documents: The information contained in these files should not be altered in any way. Attempts to change these files will adversely impact the integrity of the information and its usefulness. It is intended for use as is and will lose its usefulness if changed.

 

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