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Publications

PLEASE NOTE: The Publications System provided by the Manufacturing Systems Integration Division (MSID) has moved to: http://www.mel.nist.gov/msidlibrary/publications.html. The pages below are maintained for archival purposes only.

Publication summary

Author(s): J. Hsu, T. Hsu, J. Filliben and Ted Hopp

Publication date: 1992

Citation: J. Hsu, T. Hsu, J. Filliben and Ted Hopp: "A Comparative Study of CMM Flat-Surface Inspection Plans," NISTIR 4897, National Institute of Standards and Technology, Gaithersburg, MD, 1992.

Key words: CMM's, coordinate measuring machines, flatness, inspection plans, sampling plans, sample size determination

Availability:

Abstract:
This document reports on the findings from a collaborative effort by J. P. Hsu of the University of Texas at El Paso, T. W. Hsu (also of the same affiliation), James J. Filliben of the Statistical Engineering Division of the National Institute of Standards and Technology (NIST), and Theodore H. Hopp of the Machine Intelligence Group at NIST. The subject of the investigation was inspection sampling plans as related to coordinate measuring machines (CMM). The goal of the investigation was to compare various inspection plans, and, in particular, to make recommendations on minimal sample sizes to achieve pre-specified engineering tolerances on a CMM. The investigation is baseline in the sense that the recommendations flow from a part geometry which is--by design--fundamental (a plane) and a part characteristic which is fundamental (flatness).

This report provides details on the engineering consideratiomns that went into setting up and running an appropriate experiment, and the several quantitative and graphical data analysis steps involved in the subsequent statistical analysis. We expect that the information included in this report will be of interest to CMM users, designers, and manufacturers; and we expect such procedural detail to serve as a guideline for other researchers involved on more complicated part geometries and part characteristics.

Attention users of these documents: The information contained in these files should not be altered in any way. Attempts to change these files will adversely impact the integrity of the information and its usefulness. It is intended for use as is and will lose its usefulness if changed.

 

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