MSID Highlights MSID Opportunities MSID Partners MSID Products MEL MSID Programs MSID Conferences MSID Search MSID Staff MSID Services MSID Standards MSID Publications NIST MSID MSID MSID
Publications

PLEASE NOTE: The Publications System provided by the Manufacturing Systems Integration Division (MSID) has moved to: http://www.mel.nist.gov/msidlibrary/publications.html. The pages below are maintained for archival purposes only.

Publication summary

Author(s): David Flater

Publication date: March 2000

Citation: David Flater: "Testing for Imperfect Integration of Legacy Software Components," Proceedings of the 1st Asia-Pacific Conference on Quality Software, October 2000, 156-165.

Key words: component, integration, legacy, system, testing

Availability:

Abstract:
In the manufacturing domain, few new distributed systems are built ground-up; most contain wrapped legacy components. While the legacy components themselves are already well-tested, imperfect integration can introduce subtle faults that are outside the prime target area of generic integration and system tests. One might postulate that focused testing for integration faults could improve the yield of detected faults when used as part of a balanced integration and system test effort. We define such a testing strategy and describe a trial application to a prototype control system. The results suggest that focused testing does not add significant value over traditional black-box testing.


Attention users of these documents: The information contained in these files should not be altered in any way. Attempts to change these files will adversely impact the integrity of the information and its usefulness. It is intended for use as is and will lose its usefulness if changed.

 

Send questions or comments to Webmaster.