Roadmap for the Computer Integrated Manufacturing Application Framework

by

S. L. Stewart and James A. St. Pierre

U.S. DEPARTMENT OF COMMERCE
Technology Administration
National Institute of Standards and Technology
Gaithersburg MD 20899

Email: sstewart@nist.gov or james.st.pierre@nist.gov

A shorter paper based on these results and written for a more general audience is available as http://elib.cme.nist.gov/msid/pubs/stew96a/

Abstract

This is the final report for the first year of a joint project between the National Institute of Standards and Technology (NIST) and SEMATECH. It presents a roadmap for adoption and use of the SEMATECH CIM Framework with four components: developing a specification, reaching consensus, standardization, and testing and certification. The report includes recommendations on online electronic versions of the specification, supplier involvement, standards organizations, usage scenarios, reference implementations, and a testing and certification plan.

Keywords: Application Framework; Certification; Computer Integrated Manufacturing; Corba IDL; Electronic Document Management; Object Management Group; SEMATECH; Semiconductors; Standards; Testing

This paper was published in 1995 by SEMATECH (as Technology Transfer 95052825A-ENG) and NIST (as NISTIR 5679). It is available in three formats online: HTML with GIF graphic, Portable Document Format, and PostScript.