Dr. Rick Silver is seen preparing the scanning tunneling microscope for atomic resolution imaging. This unique facility had been used recently to fabricate sub-10 nm sized patterns on silicon and also as the experimental basis to further the understanding of step and terrace dynamics on silicon surfaces, essential to the development of atom-based standards.
Precision Engineering Division
Free use of this photo is restricted to materials that
describe NIST programs directly. Copyright is owned by the photographer. To
receive copy of the photo for use describing NIST programs
contact Beamie Young. To use the photo as stock photography
contact: Robert Rathe Photography, 9125 Kristin Lane, Fairfax, Va., 22032,
(703) 425-3442.
20912
|
