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Ultrasonic image of silicon

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Ultrasonic image of silicon

An inexpensive acoustic wave transducer developed by NIST mechanical engineers soon may make it easier for researchers to decide if new composite materials or film coatings have the right mechanical properties for specific applications. The NIST device uses sound waves to measure a material's elasticity (ability to flex under stress), while also providing details about crystal planes and surface or subsurface defects in the material. The graphic above shows a composite image made by the NIST instrument with a sample of silicon. The broken "V" wavefront is characteristic of silicon's cubic crystalline planes.

Manufacturing Metrology Division

Technology at a Glance (Spring/summer 1996) newsletter article, "Sounding" Out Improved Materials

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