|
Return to MEL's Gallery

Select a Research Area
Calibration Research

Material Removal Processes

Coordinate and Machine Tools

Laser and Optics

Surface and Nano

Interoperability / Integration

Simulation, Visualization and Modeling

Intelligent Systems

Homeland Security

Intelligent Control of Mobility Systems

Fabrication Technology

|
Ultrasonic image of silicon |
 |
 |
 |
 |
An inexpensive acoustic wave transducer
developed by NIST mechanical engineers soon may make it easier for
researchers to decide if new composite materials or film coatings
have the right mechanical properties for specific applications. The
NIST device uses sound waves to measure a material's elasticity (ability
to flex under stress), while also providing details about crystal
planes and surface or subsurface defects in the material. The graphic
above shows a composite image made by the NIST instrument with a sample
of silicon. The broken "V" wavefront is characteristic of
silicon's cubic crystalline planes.
Manufacturing Metrology Division
|
Technology
at a Glance (Spring/summer 1996) newsletter article, "Sounding" Out
Improved Materials
|
|