High-accuracy calibration of magnification standards and development of linewidth standards for control of dimensional in microelectronics manufacture being carried out with a dimensional-metrology scanning electron microscope (Sam Jones)
Precision Engineering Division Free use of this photo is restricted to materials that
describe NIST programs directly. Copyright is owned by the photographer. To
receive an unwatermarked copy of the photo for use describing NIST programs
contact Beamie Young. To use the photo as stock photography
contact: Point of View Studio, 7002 Carroll Ave., Takoma Park, MD,
20912
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