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The 2007 Event
NIST hosted the second annual
Interoperability Week on April 23-25, 2007.
The conference's
plenary session comprised three talks followed by a Q&A panel session:
Speakers/Panel Members:
- Jason Matusow, Senior Director of Intellectual
Property and Interoperability, Microsoft Corporation
- Eric Neumann, PhD, co-chair, W3C Healthcare and
Life Sciences
- Ken Thibodeau, Electronic Records Archives
Program Director, National Archives and Records Administration
Additional Panel Member (and
Banquet Speaker):
- David Prawel, President, Longview Advisors
2007 Meetings
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3D and 2D Content Representation, Analysis, and Retrieval
Monday and Tuesday, April 23-24
Technical POC: Afzal Godil,
Talapady Bhat,
Anne Plant, NIST
This meeting is being organized to bring the
research community together, increase communication among academia,
industry, and government by creating a forum for the exchange of ideas,
and to enhance transfer of technology. The workshop aims to define a
research agenda for the future, and to define the types of resources(3D
and 2D databases, evaluation methodologies, algorithms, and
interoperability) that would be useful to stimulate more research n the
field. The workshop is also to determine the type of role government
can play to help stimulate this activity.
Meeting
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Presentations
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Ontology Summit 2007
Monday and Tuesday, April 23-24
Technical
POC: Steve Ray, NIST
The challenge put before the ontology community this year is to clarify
what everyone means when they use the term "ontology". Our objective is to
define and agree to a systematic means of categorizing the many kinds of
things that are referred to as "an ontology." By doing so, the research,
development and Internet communities would have a better way of comparing,
combining and mapping ontologies to one another (apples to apples). The
range of what people call "ontologies" covers so-called "folksonomies",
taxonomies, thesauri, conceptual models, and formal logic-based models to
name just a few flavors. The Ontolog Forum plans to initiate a vigorous
on-line discussion of promising strawman structures to characterize all of
these possibilities, and more, culminating in a face-to-face meeting
during NIST's Interoperability Week 2007 (scheduled for the week of April
23, 2007). Similar to last year's summit, the meeting will release a
written communique to the international press, laying out the final
categorization structure and locating some key ontologies within it.
Remote attendees of the Ontology Summit do not
need to register for Interoperability Week, but are asked to contact
Peter Yim prior to the event to
indicate intended involvement.
Meeting
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Metrology Interoperability
Monday- Wednesday, April 23-25
Technical
POC: John Horst, NIST
Metrology Interoperability
consisted of two meetings:
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Consortium of
Consortia Planning Meeting for Metrology Interoperability
Date and Time: April 23, 2007
Meeting host: John Horst of NIST,
john.horst@nist.gov, (301)
975-3430
Meeting summary: In response to the need for a more common vision
worldwide in metrology interoperability, a proposal has been made to
form a consortium of consortia, in other words, organize the
existing groups worldwide working on metrology interoperability into
a single consortia to provide structure and unity toward our common
goal of component interoperability. A half-day session is planned to
discuss and make plans for such an organization.
Presentations
and minutes
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High-level Inspection
Process Planning for Metrology Interoperability
Date and Time: April 24 – 25, 2007
Meeting host: John Horst of NIST,
john.horst@nist.gov, (301)
975-3430
Meeting summary: At last year's International Metrology
Interoperability Summit (IMIS), a call emerged to precisely define
the information required to generate a high-level inspection process
plan. The famous DMIS standard addresses lower level process plans
for a CMM; however, there seems to be no single standard that
correctly, completely, and unambiguously addresses the information
needed to generate a high-level inspection process plan. Information
contained in such a high-level plan is envisioned to be sufficient
to drive any type of CMM: portable, fixed, contact, non-contact,
scanning, etc.
Presentations
and minutes
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Interoperability Week Plenary Session
Tuesday, April 24, 9:00 - 10:30
The plenary will consist of three talks
followed by a Q&A panel session.
Speakers/Panel Members:
- Jason Matusow, Senior Director
of Intellectual Property and Interoperability for the Microsoft
Corporation. In this role he focuses on a broad spectrum of issues
including patent reform, copyright activism, indemnification, and the
licensing of Microsoft's IP assets. Additionally, he is a leading
strategist for Microsoft's global commitment to interoperability and
has additional responsibility for the marketing and communications of
Microsoft's software standards work.
Presentation
- Eric Neumann, Senior Strategist
for Teranode Corporation, a company developing next-generation systems
for pharmaceutical companies. He is also founder and co-chair for the
W3C Semantic Web Healthcare and Life Science Interest Group (HCLSIG)
that is bringing together industry leaders to identify domain-specific
applications that will benefit from semantic web technologies. He also
has formed the Clinical Semantics Group, a consultancy group
specializing in the development of intelligent applications for
clinical trials informatics. Prior to this, Dr. Neumann was Global
Head of Knowledge Management for Scientific and Medical Affairs within
Sanofi-Aventis, covering all of global R&D. He has also developed the
first Drug Discovery semantic web dashboard called BioDash. He has
also held executive positions at Beyond Genomics, 3rd Millenium, and
Netgenics, and was an NSF-funded researcher for 6 years while at and
Bolt, Beranek, and Newman. Dr. Neumann is an expert in knowledge-based
methods for the pharmaceutical industry, and has been in the
biotechnology industries for the past 16 years.
Dr. Neumann holds an undergraduate degree from the Massachusetts
Institute of Technology, and a PhD in neurobiology and developmental
genetics from Case Western Reserve University.
- Ken Thibodeau, Director of the
Electronic Records Archives (ERA) Program at the National Archives and
Records Administration (NARA). ERA is NARA’s strategic initiative to
build a virtual archives capable of preserving all types of electronic
records and delivering them to future generations of users on future
generations of technology. Dr. Thibodeau has 30 years experience in
archives and records management, and is an internationally recognized
expert in electronic records. He has served as Chief of the Records
Management Branch of the National Institutes of Health, Director of
the Center for Electronic Records at NARA, and Director of the
Department of Defense Records Management Task Force. He earned a Ph.D.
in the history and sociology of science from the University of
Pennsylvania, and held several post doctoral fellowships in computer
science. He has been a visiting professor and lecturer at universities
in the U.S., Canada, France, Germany, Italy, and the U.K. A Fellow of
the Society of American Archivists, he has published over 30 papers
and spoken at more than 150 conferences around the world.
Additional Panel Member (and Banquet
Speaker):
- David Prawel, President, Longview
Advisors (See "Banquet Dinner" entry below for bio.)
Barbara Cuthill provided a
presentation on NIST's Advanced
Technology Program.
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Banquet Dinner
Tuesday, April 24, 7:00 PM
The featured speaker was David Prawel,
founder and president at Longview Advisors Inc., a consulting firm serving
the manufacturing industry. He has enjoyed more than 25 years in the 3D
software industry. As a consultant, speaker, author, and entrepreneur, he
provides insight and advice about 3D technology to dozens of manufacturers
and software companies around the world..
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Long Term Sustainment of Digital Information for Science and Engineering:
Putting the Pieces Together
Tuesday - Wednesday, April 24-25
Technical
POC: Josh Lubell and
Rachuri Sudarsan, NIST
Researchers at universities, in industry, and in government are developing
tools and standards for archiving and preserving the ever-increasing
volume of digital information humankind produces. Meanwhile, records
managers are grappling with maintaining their organizations' data assets
and responding to requests for electronic information from regulators,
legal investigations, and other sources. Scientists and engineers, in
addition to the aforementioned issues, want the digital models and systems
they build today to be extensible and reusable for subsequent generations
of technologists. Our discussion, a sequel to last year's highly
successful Long Term Knowledge Retention workshop, will focus on policies
of digital preservation and applying promising technologies to solve
preservation problems in product design, engineering, and manufacturing in
particular, with possible extensions to include chemistry, biology, and
other disciplines where critical information must be "future-proofed."
Meeting
Web
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Tuesday April 24
Welcome
Bill Regli, Drexel University,
Preservation of
Engineering Artifacts
Chris McMahon, University of Bath,
From knowledge management to
digital curation - a UK report and perspective
Mike Smorul, University of Maryland,
ADAPT: An Approach to Digital
Archiving and Preservation Technology
Kate Zwaard, US Government Printing Office,
FDsys Update NIST April 07
Prepare for Breakouts:
LTKR Workshop Points and
LTKR workshop.mm (a
FreeMind mind map). (See
this site for FreeMind software.)
Wednesday April 25
Report from Breakout Group 1, plus a FreeMind mind map. (See this site for
FreeMind software.)
Report from Breakout Group 2
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ODVA EtherNet/IP
Implementor Workshop #21
Tuesday- Wednesday, April 24-25
Technical
POC: Jim Gilsinn, NIST
The workshop will provide the following benefits to vendors implementing
EtherNet/IP on products:
- Educate product developers on EtherNet/IP
and Industrial Ethernet technologies
- Provide a collaborative forum for
developers to discuss common issues and solutions
- Promote EtherNet/IP device
interoperability through product design recommendations and an
interoperability validation event (PlugFest)
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