Precision Engineering Division

[skip navigation] NIST Manufacturing Engineering Laboratory National Institute of Standards and Technology Precision Engineering Division Precision Engineering Division Large-Scale Coordinate Metrology Engineering Metrology Surface and Microform Metrology Nanoscale Metrology Search

Scanning Electron Micrograph

Scanning Electron Micrograph
Figure 3.  A scanning electron micrograph of a diamond profilometer tip demonstrating the effects of charging on the secondary electron signal.


Privacy Policy, Security Notice, and Accessiblity Statement
Disclaimer / Freedom of Information Act (FOIA)
No Fear Act Policy / NIST Information Quality Standards

NIST is an agency of the U.S. Department of Commerce.

PED website comments: melwebmaster@nist.gov
Date created: March 07, 2001
Last updated: Aug. 15, 2007