Atomic Steps on Si(111)
Figure 3.
Atomic steps on Si(111) imaged in air with Calibrated Atomic Force Microscope operating in intermittent contact mode.
Privacy Policy, Security Notice, and Accessiblity Statement
Disclaimer
/
Freedom of Information Act (FOIA)
No Fear Act Policy
/
NIST Information Quality Standards
NIST is an agency of the
U.S. Department of Commerce
.
PED website comments:
melwebmaster@nist.gov
Date created: March 07, 2001
Last updated: Aug. 15, 2007