Precision Engineering Division

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Standard Reference Materials (SRM's)

The Standards Reference Materials Program (SRMP) funds certain projects at NIST under which the laboratories develop and certify SRMs, which are then made available for sale to industry.  The Surface and Microform Metrology Group is an important participant in this program and is responsible for developing and maintaining a wide range of SRM's.

The SRM's currently available that were developed by our Group are as follows:


Sinusoidal Surface Roughness Blocks  (Figure 1)


SRM Number Description
2073a 3 micrometers (nominal) roughness average (Ra), 100 micrometers (nominal) mean profile peak spacing (RSm)
2074 1 micrometers Ra,  40 micrometers RSm
2075 1 micrometers Ra,  800 micrometers RSm

Scanning Electron Microscope Magnification Standard  (Figure 2)


SRM Number Description
484g Line spacings from 0.5 micrometers to 5 micrometers

Spherical Particle Sizes  (Figure 3)


For applications in metrology, environmental, and medicine:

SRM Number Description
1691 0.3 micrometers (nominal) diameter
1690 0.9 micrometers diameter
1692 3 micrometers diameter
1960 10 micrometers diameter
1965 30 micrometers diameter
1965 Microscope slide with 10 micrometers diameter spherical particles for use with optical microscopes

In addition, the following materials are under active development or redevelopment and restocking:

SRM Number Description
2071b Sinusoidal roughness block with 0.3 micrometers Ra and 100 micrometers RSm
2809 Rockwell C calibration grade hardness indenters  (Figure 4)


SRM 2073 Sinusoidal Roughness Block with Certification Document
SRM 484 and Its Micrograph

Figure 1.  Photo of SRM 2073 sinusoidal roughness block with certification document.
Figure 2.  Illustration of the method of calculation of the height of a double-sided step.


SEM Micrograph showing Three Particle Size SRM's
A Stylus Instrument and a Prototype of the Rockwell C Hardness Indenter

Figure 3.  SEM micrograph showing three particle size SRM's (0.1 micrometers, 0.3 micrometers, and 0.9 micrometers) compared with line spacings of SRM 484. The 0.1 micrometers particle size standard was developed by G. Mulholland in the Building and Fire Research Laboratory.
Figure 4.  Measurement with a stylus instrument of a prototype of the Rockwell C hardness indenter, SRM 2809, currently under development.

Technical Contact:  Dr. Theodore V. Vorburger


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Date created: March 07, 2001
Last updated: Aug. 15, 2007